Automação do difratômetro de Raios-X para policristais Philips PW 1850/25: uma contribuição para a otimização da análise de amostras de interesse geológico
DOI:
https://doi.org/10.11137/2006_2_288-289Abstract
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Published
2006-01-01
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Section
POSTGRADUATE PROGRAM IN GEOLOGY - MASTER'S
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